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On-Wafer Parametric Test Teaching Lab for Advanced Semiconductor Device Characterization

On-Wafer Parametric Test Teaching Lab for Advanced Semiconductor Device Characterization

On-Wafer Parametric Test Teaching Lab for Advanced Semiconductor Device Characterization

Pages 6 Pages

This solution brief presents a complete educational platform for teaching wafer-level semiconductor measurement with industry-standard tools and workflows. Built around the Keysight B1500A parameter analyzer, EasyEXPERT software, probe stations, an Atto Sense Unit, and SMU-CMU switching hardware, the seven-module curriculum progresses from system setup to advanced MOSFET testing. Students perform Id-Vd and Id-Vg sweeps, identify operating regions, extract threshold voltage, measure capacitance-voltage behavior, apply open and short compensation, detect picoamp and femtoamp currents, and analyze transient responses. Application Test and Classic Test modes support both guided learning and custom research. The solution develops practical probing, noise-control, guarding, data-analysis, and er

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