This datasheet addresses the challenges of semiconductor and high-tech manufacturing, where yield loss and defects can be costly. Spotfire integrates wafer maps, process data, inspection results, and equipment logs to enable deep root cause analysis. Engineers can uncover subtle correlations, detect excursions early, and collaborate across teams to resolve issues faster. Advanced analytics, anomaly detection, and interactive visualizations reduce scrap, improve yields, and accelerate time to market. Spotfire transforms complex manufacturing data into actionable insights that drive continuous performance improvement.

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