Third Generation Multiple Application Platform (MAP-300)

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The MAP platform, introduced in 2001 under JDSU and now in its third‑generation MAP‑300 Series, remains the core of VIAVI’s optical test solutions for labs and manufacturing. Designed for unmatched scalability, it supports current and future testing needs for optical network elements, modules, and components. MAP‑300 preserves backward compatibility with existing automation while adding customer‑driven innovations, including a modern HTML‑based GUI and enhanced features that improve efficiency and usability across production environments.

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Third Generation Multiple Application Platform (MAP-300)

Third Generation Multiple Application Platform (MAP-300)

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