As semiconductor designs evolve toward greater miniaturization and complexity, researchers at IIT Delhi faced the challenge of accelerating reliability characterization for integrated circuits containing millions of transistors. To meet the demand for higher performance and compact form factors, the team integrated Keysight’s automated testing software into their research workflows. Keysight’s software provided the advanced precision and automation required to characterize component reliability rapidly, significantly reducing development cycles while ensuring rigorous accuracy. By leveraging these powerful analytical tools, the researchers successfully streamlined their testing processes, enabling more efficient innovation and providing the reliability data necessary to advance next-genera

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