This solution brief presents an integrated platform for validating passive and active photonic integrated circuits across optical and electrical domains. Tunable laser sources, optical power meters, polarization control, source measure units, and automation software enable synchronized swept-wavelength, polarization-resolved, and opto-electrical measurements. Engineers can characterize insertion loss, polarization-dependent loss, TE and TM behavior, resonances, bandwidth, photodiode responsivity, and dark current while reducing errors from fiber alignment, connector loss, and environmental variation. Single-sweep Mueller matrix techniques replace repetitive manual polarization procedures and improve throughput. The modular architecture supports waveguides, filters, resonators, grating coup

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