Case Study
Tohoku University Accelerates Ultra-Low-Noise TMR Sensor Research with Automated Wafer-Level Analysis
Tohoku University Accelerates Ultra-Low-Noise TMR Sensor Research with Automated Wafer-Level Analysis
This case study shows how Tohoku University improved development of tunnel magnetoresistive sensors for brain magnetic-field detection, compact MRI, quantum computing, mobility, energy, marine, and space applications. Its previous low-frequency noise workflow required dicing, wire bonding, shielded fixtures, and manual in-house testing, limiting throughput to about 10 devices daily. A customized Keysight E4727B Advanced Low-Frequency Noise Analyzer and probing system enabled direct wafer-level measurements with robust shielding and automated setup. Researchers achieved stable, repeatable results using only a single magnetic-shield layer and increased throughput to roughly 100–200 devices per day, accelerating material evaluation and sensor optimization.
